AC Conductance Curves on a Silicon MOS Device
Journal Title: Applied Sciences Research Periodicals (ASRP) - Year 2025, Vol 3, Issue 2
Abstract
The author presents elegant AC conductance curves on a p-Si (100) Metal-Oxide-Semiconductor (MOS) device through this brief communication. The curves were obtained on an automated AC conductance and I-V measurement system built by the author during the first Research Associate term from April 1997 to December 1999, with Professor of Physics, Dr. Mary Ellen Zvanut. She is with the Department of Physics at the University of Alabama at Birmingham (UAB), Birmingham, Alabama, USA.
Authors and Affiliations
Ravi Kumar Chanana
Keywords
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