BISR SCHEME USING BENCH MARK TESTING SEQUENTIAL CIRCUIT S27
Journal Title: GRD Journal for Engineering - Year 2016, Vol 1, Issue 0
Abstract
In this bench mark testing sequential circuit S27 is tested by using Built in Self Repair concept. This paper describes an on-chip test generation method for functional broadside tests. The hardware is based on the application of primary input sequences initial from a well-known reachable state, therefore using the circuit to produce additional reachable states. Random primary enter sequences are changed to avoid repeated synchronization and thus differed various sets of reachable states. Functional broadside tests are two-pattern scan based tests that avoid over testing by ensuring a circuit that traverses only reachable states in the functional clock cycles for a check. This consist of the input vectors and the equivalent responses. They check the proper operation of a verified design by testing the internal chip nodes. This test is useful to cover a very high percentage of modeled faults in logic circuits and their generation is the main topic of this method. Often, functional vectors are understood as verification vectors, these are used to verify whether the hardware actually matches its specification. Though, in the ATE world, any one vectors applied are understood to be functional fault coverage vectors applied during developing test, then the fault coverage area easily detected. This paper shows S27 circuit is used in Multiplier Circuit for Testing Application and it is done by Verilog Programming and simulated by Modalism 6.5version and Synthesis by Xilinx Tool
Authors and Affiliations
R. N. Nivethitha, Dr. A. Kaleel Rahuman
Keywords
Related Articles
- EP ID EP303137
- DOI -
- Views 98
- Downloads 0
The Internet of Things in Healthcare: A Survey
This paper discourses about the Internet of Things. In the Internet of Things (IOT), devices gather and share information directly with every other connected and the cloud, enabling it to record and analyze new data stre...
Medical Image Super Resolution Based On Dual Tree Complex Wavelet Transform
Abstract Most natural images can be approximated using their low-rank components. This fact has been successfully exploited in recent advancements of matrix completion algorithms for image recovery. However, a major limi...
Design of Active Voltage Regulator for Voltage Sag Mitigation
Power Quality (PQ) problems have obtained increasing attentions as they can affect lots of sensitive end-users. Studies indicate that voltage sags, transients and momentary interruptions constitute 92% of all the PQ prob...
Experimental Investigation on the Effect of Bond-Slip Behaviour of Steel Rebars in Concrete
This paper investigates about the Bond-Slip behaviour of steel rebars in reinforced concrete for Plain and Ribbed reinforcing bars. Bond strength is influenced by the rib pattern of the bar and RILEM suggested some recom...
Peltier Module for Thermoelectric Heating and Cooling
In current scenario one of the major issue is power consumption. Also, with the use of refrigerants like Freon, Ammonia in air conditioning system for cooling purposes leads to harmful gas emission and global warming and...