INVESTIGATION OF RADIATION DEGRADATION ON A CMOS MATRIX BASED HD-CAMERA
Journal Title: Международный научный журнал "Интернаука" - Year 2018, Vol 3, Issue 21
Abstract
The article deals with degradation under the influence of ionization radiation on an HD camera. All components of the test chamber were made without radiation protection, except for the lens. During the experiment, we found that the tested camera showed significant degradation after irradiation and differed from the dose rate. As the dose rate increases, these images become brighter. In addition, with the help of the progressive analysis of the degradation of the captured image, experimental results show that the signal-to-noise ratio (SNR) attenuation compared to the radiation time is not obvious at the same dose rate, and degradation is more and more serious with increasing dose capacity.
Authors and Affiliations
Dmitry Kiblyk
Keywords
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