Optimization of refraction index profile of waveguide by localization factor
Journal Title: Вісник НТУУ КПІ. Серія Радіотехніка, Радіоапаратобудування - Year 2010, Vol 0, Issue 41
Abstract
The technique allowing to define refraction index profile in cross-section of singlemode waveguide with optimum value of power localization factor is offered. Waveguides with such parametres can widely be used in practice for transfer of powerful signals.
Authors and Affiliations
V. Levandovskyy
Modeling of high-speed electronic devices
Introduction. The theme of this publication is the modeling of electronic tools that operate in the frequency range from zero to terahertz and higher. Application of new concepts and technologies, including biotechnology...
Automatic EEG eye movement artifacts removal using Independent Component Analysis
Background. Eye movement artifacts contained in EEG recordings hamper a lot the automatic processing and analysis of EEG signal. Therefore, the removal of such artifacts is important stage for any further signal processi...
Optimization criterial of model of the radio electronic device
The features of designing of radio electronic devices structural - optimized by method are considered. The basic functional - constructive characteristics of the device are submitted as system criterial of the equations,...
System for measuring electric resistance skin
Introduction. To measure the electrical resistance of leather frequently used system for applying testing signals from external current sources or voltage. Power testing signals the maximum limit, when they Electro studi...
The hyperbolic-accidental characteristics of thermal processes in devices of the radioelectronic apparatus
Thermal process in devices REА are submitted as hyperbolic-accidental of function. Are considered е of the characteristic of mathematical models and their decisions. The example of definition of the numerical characteris...