Scanning Electron Microscopy (SEM) of Multilayer CdS Thin Films

Abstract

The first thin solid films were obtained by electrolysis in 1864, B White Bunsen and Grover obtained metallic film in the year 1852, by thermal evaporation on explosion of a current carrying metal wire. The usefulness of optical properties of metal films and scientific curiosity about the behavior of two dimensional solid have been responsible for the immense interest in the study of the science and technology of thin films. In this paper we shall study the SEM of multilayer CdS thin film.

Authors and Affiliations

Vishal Kumar Sharma, Mahendra Kumar

Keywords

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  • EP ID EP18998
  • DOI -
  • Views 290
  • Downloads 10

How To Cite

Vishal Kumar Sharma, Mahendra Kumar (2014). Scanning Electron Microscopy (SEM) of Multilayer CdS Thin Films. International Journal for Research in Applied Science and Engineering Technology (IJRASET), 2(10), -. https://www.europub.co.uk/articles/-A-18998