PROF. DR HAB. INŻ. STANISŁAW ADAMCZAK HONORIS CAUSA DOCTORATE, UNIVERSITY OF ZILINA (SLOVAKIA)
Journal Title: Metrology and Measurement Systems - Year 2008, Vol 15, Issue 1
Abstract
On 16 November 2007, Prof. dr hab. inż. Stanisław Adamczak, Dean of the Faculty of Mechatronics and Machine Building at the Kielce University of Technology, member of the Committee on Metrology and Research Equipment and of the Committee on Machine Building of the Polish Academy of Sciences, head of the Chair of Mechanical Engineering and Metrology, received the Honoris Causa Doctorate from the University of Zilina in recognition of his outstanding teaching and research achievements in science and engineering as well as for the thirty-year cooperation with this Slovak university.
Authors and Affiliations
STEFAN MEDVECKY
TWO-PARAMETER MEASUREMENTS AND SIGNAL CONDITIONING IN DOUBLE-CURRENT SUPPLY FOUR-TERMINAL RESISTANCE CIRCUITS
A new type of the four-terminal (4T) bridge circuit unconventionally supplied by current sources connected in parallel to opposite arms, named double current bridge (2J) is presented. It has two different outputs from bo...
FORMAL DEFINITION AND PROPERTIES OF FEB-BASED ENOB OF INTELLIGENT CYCLIC ADC
The paper presents a new approach to the measurement of effective resolution (effective number of bits - ENOB) of the cyclic A/D converters (CADCs). The core idea of the approach is a direct measurement of ENOB using, as...
REPORT ON IMEKO TC4 SYMPOSIUM & ADC WORKSHOP<br /> IN GDYNIA/JURATA, SEPTEMBER 2005
The 14th International Symposium on New Technologies in Measurement and Instrumentation as well as the 10th Workshop on ADC Modeling and Testing took place in Gdynia (Opening Ceremony and Plenary Session) and Jurata (Wor...
FREQUENCY-RESPONSE COMPENSATION OF DISTORTING PARTS OF MEASUREMENT SYSTEMS
In this article a class of digital correction filters is presented. This class of filters has been synthesized in an optimization procedure where two criteria are considered. The first criterion is an approximation of th...
A NEW TRANSDUCER OF DOUBLE PROCESSING FOR CAPACITIVE TOMOGRAPHY
The paper presents a new solution of a system for the measurement of small capacities, applied in capacitive tomography. Some known versions of transducers have been discussed. Next, the author has presented his own solu...